Infinitesima announces the shipment of RPM-3D to imec for the joint development of 3D tomographic metrology.
Read the recent article in Semiconductor Engineering about Next Generation AFM
Infinitesima will be presenting a joint paper with IMEC on EUV mask metrology on Wednesday, June 9.
Check out the 2021 EUVL Workshop Agenda & Abstract Book
Infinitesima presented a joint paper with IMEC on EUV mask metrology at the 2021 EUVL On-Line Workshop on June 9
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