Infinitesima announces the shipment of RPM-3D to imec for the joint development of 3D tomographic metrology.

Read the recent article in Semiconductor Engineering about Next Generation AFM

semi engineering


Infinitesima will be presenting a joint paper with IMEC on EUV mask metrology on Wednesday, June 9.

Check out the 2021 EUVL Workshop Agenda & Abstract Book

EUVL Workshop