Continuing Moore’s Law requires increasingly complex 3D structures controlled to sub nanometer tolerances. Current optical and e-beam inspection & metrology techniques lack the resolution and 3D capability required to measure these tolerances. This creates an opportunity for a new technology to participate in the $7.2B Semiconductor process diagnostics market.

Infinitesima has developed a fundamentally different atomic force 3D surface measurement technique, the Rapid Probe Microscope. This combines revolutionary thermal-optical actuation with an interferometric measurement system delivering picometer precision and speeds >100x faster than those achievable with conventional Atomic Force Microscope systems.

Founder & CTO

“At Infinitesima we are focussed on enabling tomorrow’s semiconductors by delivering true 3D nanoscale information”.

President & CEO

“We strive to add value to our customers by providing accurate 3D measurement & analysis with our innovative RPM technology”.