Today's nano-scale imaging solutions, such as AFM or SEM, suffer from long imaging times, the lack of 3D information or the restrictions of using a vacuum chamber. Rapid Probe Microscopy (RPM™) eliminates these restrictions by taking high-speed 3D images in the open atmosphere. The RPM™ has been developed to be compatible with existing semiconductor industry automated tools and replace or work along side existing imaging technologies.
Rapid Probe Microscopy (RPM) provides nano-scale images with information in less than a second. It is useful in numerous applications and all of the main market segments where nano-scale imaging and metrology is required. For further information on the markets served by our technology, select the appropriate link below or contact us directly to become a member of our Partner Program.
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