Today's nano-scale imaging solutions suffer from long imaging times, or the restrictions of using a vacuum chamber. Rapid Probe Microscopy (RPM™) solves both of these problems by taking images in a fraction of a second in the open atmosphere. RPM™ is a non-destructive process which is compatible with a wide range of samples. The process has wide applicability to existing applications.
Rapid Probe Microscopy (RPM) provides nano-scale images with information in less than a second. It is useful in numerous applications and all of the main market segments where nano-scale imaging and metrology is required. For further information on the markets served by our technology, select the appropriate link below or contact us directly to become a member of our Partner Program.
Oxford, UK - February 2012